* 高准确性分光光度计\椭偏仪薄膜度量系统和软件分析产品 high
resolution spectrophotometry\ellipsometry thin-film metrology
systems and analysis software products
* 用于薄膜材料识别的度量衡系统，拥有的型号(模型)范围从适用于R&D的桌面系统到全自动的独立的生产工具及用于薄膜分析和设计的软件产品
metrology systems for thin-film material characterization,
with models that range from table-top systems suitable for
R&D to fully automated, standalone production tools, and
software products for thin-film analysis and design.
* 应用于半导体、光电子、数据存储、展示、MEMS及光学涂层仪器Application: semiconductor,
optoelectronics, data storage, display, MEMS, and optical
coating industries.
* SCI的薄膜设计软件FilmWizard，界面友好，计算能力强，能满足多种膜系的设计。
现提供试用版，申请流程如下：
1、下载试用版http://www.sci-soft.com/SCIDemos.htm
2、email info@sci-soft.com 获取相关的密码信息。
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